Contactless geometric and thickness imperfection measurement system for thin-walled structures

Lyssakow, Pawel (Corresponding author); Friedrich, Linus Michael; Krause, Max; Dafnis, Athanasios Dimitri; Schröder, Kai-Uwe

Amsterdam [u.a.] : Elsevier Science (2019, 2020)
Fachzeitschriftenartikel

In: Measurement
Band: 150
Seite(n)/Artikel-Nr.: 107038